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Home / Exhibitions - Conferences
Exhibitions - Conferences

CIE EXPERT SYMPOSIUM
on
Advances in Photometry and Colorimetry

7-8 July 2008
Turin (Torino), Italy



Background:
This Symposium will focus on recent research and developments in physical photometry and colorimetry, particularly on applications of imaging luminance measurement devices, including near-field goniophotometers, for measurement of light sources, luminaires, displays, and lighting environments. Another focus will be on the measurement of spectral characteristics of photometers and colorimeters, including the degree of the V(lambda) match (the f1’), whose uncertainty is often questioned. Other topics of new developments in physical photometry and colorimetry will also be covered. The meeting is organized by CIE Division 2 and hosted by INRIM (Istituto Nazionale di Ricerca Metrologica) in Turin, Italy. There will be CIE Division 2 meetings in conjunction with this Symposium.

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