A double beam photometer with directed 8° sample irradiation and hemispherical measurement set-up is used for the Spectral Reflectance Calibration. The sample is irradiated with a collimated monochromatic light beam of 8 x 15 mm :

 KRW-S1-01, Calibration of 8°/D from 250 to 2500 nm in 50 nm steps,
 KRW-S1-02, Calibration of 8°/D from 250 to 2500 nm in 1 nm steps,
 KRW-S1-RP, set-up charge for non Gigahertz-Optik detectors.




A very low stray-light double monochromator with collimated light beam is used to irradiate the sample for the Spectral Transmittance Calibration:

 KTW-S1-01, Calibration from 350 to 1100 nm in 1 nm steps of non diffuse samples,
 KTW-S2-01, Calibration from 250 to 2500 nm in 50 nm steps of non-diffuse samples,
 KTW-S1-RP, set-up charge for non Gigahertz-Optik detectors.




Both calibrations supplied with factory calibration certificate.

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