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The Bi-Tech Sensor - BTS - brings two light sensor technologies together:
CIE/DIN photometric V(λ), colorimetric or radiometric integral detectors are combined with a diode array
The integral detector’s function is to measure the incident light intensity in absolute light measurement quantities
The diode array detector’s function is to measure the spectral distribution of the incident light
The stored diode array data is used for real time computational correction of the integral detector’s systematical spectral uncertainty as well as for peak wavelength, luminous color data and color rendering index measurements.
The X4 Light Analyzer employs BTS two sensor technology: The X4 integral detector offers a fine match to CIE photopic, radiometric or colorimetric function enabling its stand alone use in applications requiring wide dynamic range and fast data logger operations unachievable with diode array detectors.
In the BTS mode the integral detector readings are corrected on-line using the diode array’s measured spectral distribution data of the light source under test.
The measurement uncertainty of the X4 in the BTS mode is on par with laboratory reference photometers, colorimeters and radiometers as well as high level spectral radiometers. In BTS mode the dynamic range is limited to that of the diode array.
The diode array detector enables X4 Light Analyzer use as a diode array spectrometer providing spectral distribution data of test light sources and evaluation of peak wavelength. The diode array by itself allows colorimetric calculations for all kinds of light sources. Optionally an integral tristimulus detector can be used to improve the accuracy level of luminous color measurements.
At the heart of the X4 Light Analyzer is its dual technology sensor (BTS) set-up. This unique design permits several sensors to detect light through only one shared window.
A compact size high efficiency light integrator is located behind a large 1 cm² (12 mm diameter) diffuse window. This makes it possible to simultaneously operate up to four integral detectors for intensity measurements in absolute units, data logging with fast sampling rates and for the measurement of light emitted outside of the diode array sensor’s spectral sensitivity range.
Detected light is transmitted to the external X4 electronic unit by a light guide positioned to directly view the back side of the input window. A manually controlled attenuator allows selection of the optimal sensitivity range of the diode array sensor. The measured spectral distribution data is used for on-line a(Z) correction of the integral sensor and for calculation of the colorimetric data. The diode array sensor is also useful for general purpose spectral distribution measurement applications. The integral detectors are calibrated in absolute light measurement units traceable to national standards by Gigahertz-Optik’s optical radiation calibration department.
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