Gigahertz Optik GmbH (Headquarter)
Phone: +49 (0)8193-93700-0

Gigahertz-Optik, Inc. (US office)
Phone: +1-978-462-1818


You can add products to the wish list and compare them with one another or send us an inquiry. There are wish list symbols on product pages and product tables for this purpose.

Product categories

Below you will find an overview of the product categories from Gigahertz-Optik

Light meters, Detectors, UV-VIS-NIR Radiometers

Devices and systems for photometric, radiometric and colorimetric measurements of light and optical radiation.

Spectral light meters, UV-VIS-NIR spectroradiometers

Spectroradiometers for use as portable devices and fixed installation systems for measuring the spectral distribution of sources over the UV-visible-NIR wavelength range in absolute units.

Spectrophotometers, Laboratory and Analysis Systems

Instruments, accessories and calibration standards for in-situ and ex-situ optical transmission, reflection, absorption, and photoluminescence measurements.

Integrating spheres

Integrating spheres for setting-up measurement systems for measuring light and optical radiation, transmission, reflection and absorption as well as for integrating sphere light sources.

Uniform light sources, luminance standards

Uniform light sources for the adjustment of pixels and intensity of image sensors and cameras as well as for the calibration of luminance and spectral radiance.

Reflectance materials and coatings

Diffuse reflective materials. Synthetics for the production of integrating spheres, laser resonators and reflection standards. Barium sulfate coating (BaSO4) for integrating spheres and reflectors.

Calibration standards & Calibration Services

Traceable calibrated reference lamps, detectors and reflectors for the calibration and adjustment of sensors and measurement devices for light, optical radiation and light reflection.

Opto-Mechanics, Electronics, Software, Accessories

A variety of complementary products expand the function of our measuring instruments and support the configuration of complete measuring systems.